Wafer Sort STATS ChipPAC offers full service Wafer Sort production lines handling 300mm (12 inch), 200mm (8 inch) or 150mm (6 inch) wafers.
he paradigm for test is changing rapidly. Originally, for example, testing at wafer probe was employed for two purposes: The first was to weed out
Probe Card Cleaning by International Test Solutions provides maximized wafer yield, increased throughput and improved tool uptime.
Figure 5. Example of membrane probe with tuning circuitry, zoomed needles (courtesy of Cascade Microtech Inc.) and bandwidth. The probe assembly connects the wafer probe, the probe card and the DUT board with the probe
June 3June 3-6, 2007-6, 2007 IEEE SW Test WorkshopIEEE SW Test Workshop 22 Tutorial Overview • Part I – Fundamentals – Wafer Sort “A Very Basic Overview” – Probe Card Technologies – Contact Resistance (CRES)
The SW Test EXPO is the Who’s Who of industry leaders in the semiconductor wafer test industry. The top probe card, probe equipment and related service suppliers will showcase the latest products and services at SW Test 2018.
Our Products. Your Solution. International Test Solutions is the world leader in developing and providing engineered cleaning solutions that improve yield, reduce ...
STAr's functional tests cantilever probe cards represents the finest epoxy technology on the market for wafer-sort, built-in self-tests (BIST), known good die (KGD), burn-in, etc.
the application of thin films, depositing a small puddle of a fluid resin onto the center of a substrate and then spinning the substrate at high speed
Well here is the one card type that I personally helped to bring about. To start this story off then I used to supply a popular PCB version where after time I decided that a wafer version would be better.
Merging of multiple STDF files. Combine final test files from multiple steps or fab wafer sort re-probe sessions into one file for product characterization or …
I now want to take a step back and take a broader view of our largest business. Earlier this week, VLSI Research published its annual survey of the probe card market, showing FormFactor, again, grew share from our leadership position, to capture over 1/3 of the $1.3 billion advanced probe card market.
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第二章 半導體測試基本概念 半導體產品，一般稱為積體電路。英文稱為 Semiconductor Device。Device在中文意義為『設備』或『裝置』。
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